Nonlinear-Embedding Design Methodology Oriented to LDMOS Power Amplifiers

被引:20
作者
Bosi, Gianni [1 ]
Raffo, Antonio [1 ]
Trevisan, Francesco [1 ]
Vadala, Valeria [1 ]
Crupi, Giovanni [2 ]
Vannini, Giorgio [1 ]
机构
[1] Univ Ferrara, Dept Engn, I-44122 Ferrara, Italy
[2] Univ Messina, Dept Biomed & Dent Sci & Morphofunct Imaging, I-98125 Messina, Italy
关键词
Power amplifiers (PAs); power MOSFETs; power semiconductor devices; semiconductor device measurement; semiconductor device modeling; EFFICIENCY; CAPACITANCE; MODEL;
D O I
10.1109/TPEL.2017.2783046
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper, we apply for the first time the nonlinear-embedding technique to the design of power amplifiers (PAs) based on laterally-diffused metal-oxide-semiconductor (LDMOS) field-effect transistors. Such a design technique is based on setting the transistor load line at the intrinsic current-generator plane, according to well-known theoretical guidelines. Then, the selected operating condition can be transposed at any design frequency at the extrinsic transistor terminals, by means of a model of the device nonidealities, such as the nonlinear intrinsic capacitances and the linear parasitic effects. A harmonically-tuned high-efficiency class-F and a wideband class-AB PAs operating within the FM broadcasting band 88 divided by 108 MHz based on a 10-W LDMOS are then designed and realized. To definitely assess the validity of the proposed approach for the LDMOS technology, we compare the measured performance on the fabricated PAs with the expected predictions.
引用
收藏
页码:8764 / 8774
页数:11
相关论文
共 48 条
[1]   Enhancement of the Broadband Efficiency of a Class-J Power Amplifier With Varactor-based Dynamic Load Modulation [J].
Amirpour, Raul ;
Darraji, Ramzi ;
Ghannouchi, Fadhel ;
Quay, Ruediger .
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2017, 27 (02) :180-182
[2]  
Angelov I., 1992, 1992 IEEE MTT-S International Microwave Symposium Digest (Cat. No.92CH3141-9), P1583, DOI 10.1109/MWSYM.1992.188320
[3]  
[Anonymous], 2016, P 16 MED MICR S
[4]   Waveforms-Only Based Nonlinear De-Embedding in Active Devices [J].
Avolio, Gustavo ;
Schreurs, Dominique M. M. -P. ;
Raffo, Antonio ;
Crupi, Giovanni ;
Vannini, Giorgio ;
Nauwelaers, Bart .
IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2012, 22 (04) :215-217
[5]   Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests [J].
Belaid, M. A. ;
Ketata, K. ;
Gares, M. ;
Mourgues, K. ;
Masmoudi, M. ;
Marcon, J. .
MICROELECTRONICS RELIABILITY, 2007, 47 (01) :59-64
[6]  
Boonthong P., 2015, P 2015 INT COMPUTER, P1
[7]  
Bosi G, 2014, 2014 9TH EUROPEAN MICROWAVE INTEGRATED CIRCUIT CONFERENCE (EUMIC), P329, DOI 10.1109/EuMIC.2014.6997859
[8]   Nonlinear modeling of LDMOS transistors for high-power FM transmitters [J].
Bosi, Gianni ;
Crupi, Giovanni ;
Vadala, Valeria ;
Raffo, Antonio ;
Giovannelli, Antonello ;
Vannini, Giorgio .
INTERNATIONAL JOURNAL OF NUMERICAL MODELLING-ELECTRONIC NETWORKS DEVICES AND FIELDS, 2014, 27 (5-6) :780-791
[9]   Continuous Mode Power Amplifier Design Using Harmonic Clipping Contours: Theory and Practice [J].
Canning, Tim ;
Tasker, Paul J. ;
Cripps, Steve C. .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 2014, 62 (01) :100-110
[10]   Strengthen Anti-ESD Characteristics in an HV LDMOS With Superjunction Structures [J].
Chen, Shen-Li ;
Lai, Yi-Sheng .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2015, 30 (05) :2375-2382