X-ray spectroscopic characterization of organic semiconductor nanowires

被引:0
|
作者
Mazaheripour, Amir [2 ]
Husken, Nina [3 ]
Jocson, Jonah [2 ]
Kladnik, Gregor [4 ]
Cossaro, Albano [5 ]
Floreano, Luca [5 ]
Verdini, Alberto [5 ]
Burke, Anthony [2 ]
Miller, Kelsey [1 ]
Masurkar, Amrita [6 ]
Kymissis, John [6 ]
Cvetko, Dean [4 ]
Morgante, Alberto [5 ]
Gorodetsky, Alon [2 ]
机构
[1] Mt St Marys Coll, Los Angeles, CA USA
[2] Univ Calif Irvine, Irvine, CA USA
[3] Univ Bochum, Bochum, Germany
[4] Univ Ljubljana, Ljubljana, Slovenia
[5] CNR, Lab TASC IOM, Trieste, Italy
[6] Columbia Univ, New York, NY USA
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
428
引用
收藏
页数:1
相关论文
共 50 条
  • [1] X-ray spectroscopic characterization of organic semiconductor nanowires
    Mazaheripour, Amir
    Huesken, Nina
    Jocson, Jonah-Micah
    Kladnik, Gregor
    Cossaro, Albano
    Floreano, Luca
    Verdini, Alberto
    Burke, Anthony
    Miller, Kelsey
    Marsukar, Amrita
    Kymissis, Ioannis
    Cvetko, Dean
    Morgante, Alberto
    Gorodetsky, Alon
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2016, 251
  • [2] X-ray characterization of semiconductor nanostructures
    Holy, Vaclav
    Buljan, Maja
    Lechner, Rainer T.
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2011, 26 (06)
  • [3] CdZnTe semiconductor detectors for spectroscopic x-ray imaging
    Szeles, Csaba
    Soldner, Stephen A.
    Vydrin, Steve
    Graves, Jesse
    Bale, Derek S.
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2008, 55 (01) : 572 - 582
  • [4] Organic semiconductor devices for X-ray imaging
    Blakesley, J. C.
    Keivanidis, P. E.
    Campoy-Quiles, M.
    Newman, C. R.
    Jin, Y.
    Speller, R.
    Sirringhaus, H.
    Greenham, N. C.
    Nelson, J.
    Stavrinou, P.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2007, 580 (01): : 774 - 777
  • [5] Characterization of semiconductor materials by X-ray scattering
    Stömmer, R
    Nielen, H
    Iberl, A
    ANALYTICAL AND DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS, DEVICES, AND PROCESSES, 1999, 99 (16): : 117 - 133
  • [6] X-RAY CHARACTERIZATION OF SEMICONDUCTOR SURFACES AND INTERFACES
    PLOTZ, W
    HOLY, V
    HOOGENHOF, WVD
    LISCHKA, K
    JOURNAL DE PHYSIQUE III, 1994, 4 (09): : 1565 - 1571
  • [7] X-ray photoelectron spectroscopic characterization of zeolites
    Okamoto, Y
    CRITICAL REVIEWS IN SURFACE CHEMISTRY, 1995, 5 (04): : 249 - 274
  • [8] Soft X-ray Spectroscopic Characterization of Montmorillonite
    Rubensson, J-E
    Hennies, F.
    Werme, L. O.
    Karnland, O.
    SCIENTIFIC BASIS FOR NUCLEAR WASTE MANAGEMENT XXXII, 2009, 1124 : 257 - +
  • [9] Organic Semiconductor Single Crystals for X-ray Imaging
    Chen, Mingxi
    Sun, Lingjie
    Ou, Xiangyu
    Yang, Huanghao
    Liu, Xiaogang
    Dong, Huanli
    Hu, Wenping
    Duan, Xiangfeng
    ADVANCED MATERIALS, 2021, 33 (43)
  • [10] Soft X-ray characterisation of organic semiconductor films
    McNeill, Christopher R.
    Ade, Harald
    JOURNAL OF MATERIALS CHEMISTRY C, 2013, 1 (02) : 187 - 201