Ratchet effect in surface electromigration: Smoothing surfaces by an ac field

被引:100
作者
Derenyi, I
Lee, C
Barabasi, AL [1 ]
机构
[1] Univ Notre Dame, Dept Phys, Notre Dame, IN 46556 USA
[2] Eotvos Lorand Univ, Dept Atom Phys, H-1088 Budapest, Hungary
关键词
D O I
10.1103/PhysRevLett.80.1473
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We demonstrate that for surfaces that have a nonzero Schwoebel barrier the application of an ac field parallel to the surface induces a net electromigration current that points in the descending step direction. The magnitude of the current is calculated analytically and compared with Monte Carlo simulations. Since a downhill current smoothes the surface, our results imply that the application of ac fields can aid the smoothing process during annealing and can slow or eliminate the Schwoebel-barrier-induced mound formation during growth. [S0031-9007(97)05220-4].
引用
收藏
页码:1473 / 1476
页数:4
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