First applications of electron energy-loss spectroscopy with high energy resolution

被引:0
作者
Kothleitner, G [1 ]
Mitterbauer, C [1 ]
Grogger, W [1 ]
Zandbergen, H [1 ]
Tiemeijer, P [1 ]
Freitag, B [1 ]
Barfels, M [1 ]
Hofer, F [1 ]
机构
[1] Graz Univ, Res Inst Electron Microscopy, A-8010 Graz, Austria
来源
SPATIALLY RESOLVED CHARACTERIZATION OF LOCAL PHENOMENA IN MATERIALS AND NANOSTRUCTURES | 2003年 / 738卷
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new transmission electron microscope equipped with a monochromator and a high resolution energy-filter was used for the first time to fully exploit the chemical bonding information contained in the near edge fine structures (ELNES) of electron energy-loss spectra. The instrument is capable of acquiring spectra with an energy resolution in the range of 0.1 eV, thus opening up the way for improved ELNES information. ELNES spectra of TiO2 and CoO have been recorded and are compared with data obtained with a conventional microscope and with x-ray absorption spectroscopy. In case of the L-2,L-3 edges of the transition metals the new instrument revealed previously unobservable fine structure details, but for the O K edges the improved energy resolution does not result in more detailed structural features than observable in common microscopes. Furthermore, the potential of the new microscope to obtain chemical bonding information at the nanometer scale is discussed.
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页码:27 / 32
页数:6
相关论文
共 17 条
[1]   STEIGERUNG DER AUFLOSUNG BEI DER ELEKTRONEN-ENERGIEANALYSE [J].
BOERSCH, H ;
GEIGER, J ;
HELLWIG, H .
PHYSICS LETTERS, 1962, 3 (02) :64-66
[2]  
BRINK HA, 2001, MICROSC MICROANAL S2, V7, P908
[3]   ELECTRON-ENERGY LOSS AND X-RAY ABSORPTION-SPECTROSCOPY OF RUTILE AND ANATASE - A TEST OF STRUCTURAL SENSITIVITY [J].
BRYDSON, R ;
SAUER, H ;
ENGEL, W ;
THOMAS, JM ;
ZEITLER, E ;
KOSUGI, N ;
KURODA, H .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1989, 1 (04) :797-812
[4]   OXYGEN 1S X-RAY-ABSORPTION EDGES OF TRANSITION-METAL OXIDES [J].
DEGROOT, FMF ;
GRIONI, M ;
FUGGLE, JC ;
GHIJSEN, J ;
SAWATZKY, GA ;
PETERSEN, H .
PHYSICAL REVIEW B, 1989, 40 (08) :5715-5723
[5]   CARBON AND OXYGEN K-EDGE PHOTOIONIZATION OF THE CO MOLECULE [J].
DOMKE, M ;
XUE, C ;
PUSCHMANN, A ;
MANDEL, T ;
HUDSON, E ;
SHIRLEY, DA ;
KAINDL, G .
CHEMICAL PHYSICS LETTERS, 1990, 173 (01) :122-128
[6]  
KAHL F, 1998, INT C ELECT MICROSCO, V1, P71
[7]   Electron energy-loss near-edge structure - a tool for the investigation of electronic structure on the nanometre scale [J].
Keast, VJ ;
Scott, AJ ;
Brydson, R ;
Williams, DB ;
Bruley, J .
JOURNAL OF MICROSCOPY, 2001, 203 :135-175
[8]   NATURAL WIDTHS OF ATOMIC K-LEVELS AND L-LEVELS,K-ALPHA X-RAY-LINES AND SEVERAL KLL AUGER LINES [J].
KRAUSE, MO ;
OLIVER, JH .
JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA, 1979, 8 (02) :329-338
[9]   ELNES OF 3D TRANSITION-METAL OXIDES .1. VARIATIONS ACROSS THE PERIODIC-TABLE [J].
KRIVANEK, OL ;
PATERSON, JH .
ULTRAMICROSCOPY, 1990, 32 (04) :313-318
[10]  
MITTERBAUER C, IN PRESS ULTRAMICROS