Estimation of Rise Time of Discharge Current for Air Discharge of ESD-Gun with Low Charge Voltages

被引:0
作者
Mori, Ikuko [1 ]
Fujiwara, Osamu [2 ]
机构
[1] Suzuka Natl Coll Technol, Dept Elect & Informat Engn, Suzuka, Mie 5100294, Japan
[2] Nagoya Inst Technol, Grad Sch Engn, Showa Ku, Nagoya, Aichi 4668555, Japan
来源
PRZEGLAD ELEKTROTECHNICZNY | 2010年 / 86卷 / 03期
关键词
Electrostatic discharge generator (ESD-gun); air discharges; rise time; complex frequency response for vertical amplifier of oscilloscope;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With a 12-GHz digital oscilloscope, we measured discharge current waveforms for air discharges of an ESD-gun less than 1 kV onto a 50-Omega SMA connector. To grasp real rise time of the observed waveforms, we reconstructed input current waveforms from complex frequency responses of the first and second order for the vertical amplifier of oscilloscopes, and estimated the rise time concerning them. As a result, we found that the frequency response measured for the oscilloscope agrees well with that of second order, which gives a minimum rise time of 27 ps at 300V.
引用
收藏
页码:54 / 56
页数:3
相关论文
共 8 条
[1]  
Agilent Technologies Inc, 2003, 1420 AG TECHN, P1
[2]  
[Anonymous], 2008, IEC 61000-4-2
[3]  
Honda M., 1995, Journal of IEICE, V78, P849
[4]   On the determination of dynamic errors for rise time measurement with an oscilloscope [J].
Mittermayer, C ;
Steininger, A .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1999, 48 (06) :1103-1107
[5]   Correction of OFDM signal form in time domain to reduce ICI due to the Doppler spread and carrier frequency offset [J].
Mkrtchyan, G ;
Mori, K ;
Kobayashi, H .
IEICE TRANSACTIONS ON COMMUNICATIONS, 2005, E88B (01) :122-133
[6]  
MORI I, 2006, P 4 AS PAC C ENV EL, V1, P34
[7]   Oscilloscope influence on the calibration uncertainty of the pulse rise time of ESD simulators [J].
Sroka, J .
2003 IEEE International Symposium on Electromagnetic Compatibility (EMC), Vols 1 and 2, Symposium Record, 2003, :378-381
[8]  
Takagi T., 1996, Transactions of the Institute of Electronics, Information and Communication Engineers B-II, VJ79B-II, P718