Coherent x-ray imaging of defects in colloidal crystals

被引：27

作者：

Gulden, J. ^{[1
]}

Yefanov, O. M. ^{[1
]}

Mancuso, A. P. ^{[1
]}

Abramova, V. V. ^{[2
]}

Hilhorst, J. ^{[2
]}

Byelov, D. ^{[2
]}

Snigireva, I. ^{[3
]}

Snigirev, A. ^{[3
]}

Petukhov, A. V. ^{[2
]}

Vartanyants, I. A. ^{[1
]}

机构：

[1] DESY, D-22607 Hamburg, Germany

[2] Univ Utrecht, Debye Inst, Vant Hoff Lab Phys & Colloid Chem, NL-3508 TB Utrecht, Netherlands

[3] ESRF, F-38043 Grenoble, France

来源：

PHYSICAL REVIEW B | 2010年 / 81卷 / 22期

关键词：

PHASE RETRIEVAL; DIFFRACTION; SCATTERING;

D O I：

10.1103/PhysRevB.81.224105

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Coherent x-ray diffractive imaging (CXDI) was applied to reveal the structure of colloidal crystals. The colloidal sample was illuminated by a coherent x-ray beam through a 7 mu m pinhole aperture. The resulting diffraction patterns contain several Bragg peaks and an additional interference structure between the peaks due to the coherent illumination of a finite part of the sample. The inversion of these diffraction patterns reveals the arrangement of colloidal particles in a face-centered cubic (fcc) lattice as well as defects in the form of stacking faults in the (111) planes.

引用

页数：6

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