Ferromagnetic resonance force microscopy on a thin permalloy film

被引:16
作者
Nazaretski, E.
Martin, I.
Movshovich, R.
Pelekhov, D. V.
Hammel, P. C.
Zalalutdinov, M.
Baldwin, J. W.
Houston, B.
Mewes, T.
机构
[1] Los Alamos Natl Lab, Los Alamos, NM 87545 USA
[2] Ohio State Univ, Dept Phys, Columbus, OH 43210 USA
[3] SFA Inc, Crofton, MD 21114 USA
[4] USN, Res Lab, Washington, DC 20375 USA
[5] Univ Alabama, Dept Phys & Astron, Tuscaloosa, AL 35487 USA
关键词
D O I
10.1063/1.2747171
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ferromagnetic resonance force microscopy (FMRFM) offers a means of performing local ferromagnetic resonance. The authors have studied the evolution of the FMRFM force spectra in a continuous 50 nm thick permalloy film as a function of probe-film distance and performed numerical simulations of the intensity of the FMRFM probe-film interaction force, accounting for the presence of the localized strongly nonuniform magnetic field of the FMRFM probe magnet. Excellent agreement between the experimental data and the simulation results provides insight into the mechanism of FMR mode excitation in a FMRFM experiment. (c) 2007 American Institute of Physics.
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页数:3
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