Observation of HCI-induced nanostructures with a scanning probe microscope

被引:14
作者
Tona, Masahide [1 ,2 ]
Watanabe, Hirofumi [1 ,2 ]
Takahashi, Satoshi [1 ]
Fujita, Yuso [1 ]
Abe, Takashi [1 ]
Jian, Sun [1 ]
Nakamura, Nobuyuki [1 ]
Yoshiyasu, Nobuo [1 ]
Yamada, Chikashi [1 ]
Sakurai, Makoto [3 ]
Ohtani, Shunsuke [1 ,2 ]
机构
[1] Univ Electrocommun, Inst Laser Sci, Dept Appl Phys & Chem, Chofu, Tokyo 1828585, Japan
[2] Japan Sc & Technol Agcy, CREST, Chofu, Tokyo 1828585, Japan
[3] Kobe Univ, Dept Phys, Kobe, Hyogo 6578501, Japan
来源
HCI 2006: 13TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS | 2007年 / 58卷
基金
日本科学技术振兴机构;
关键词
D O I
10.1088/1742-6596/58/1/074
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
We present scanning tunneling microscope (STM) images, atomically resolved, of the nanostructures on various kinds of surfaces bombarded with highly charged ions (HCIs). In the STM image of a highly oriented pyrolytic graphite surface (Xe29+-impact), a protrusion structure was observed with root 3 x root 3 R30 degrees surface reconstruction around the impact site. A crater-like structure was formed on a Si (111)-(7 x 7) surface by an I50+-HCI impact. An atomic image of similar to 0.1 nm in height was also observed around the missing topmost layers of the crater. In the case of a TiO2 (1 1 0) surface, a typical nanostructure induced by a single I51+-HCI impact, relatively larger crater structure than that on the Si surface was observed; the height (similar to 1 nm) was higher than the atomic step of the TiO2(110)-(1 x 1) surface (similar to 0.3 nm) and the depth reached at least 1.5 nm. This implies that the degree of the HCI-radiation effect on the TiO2 surface is higher than that of the Si(111) case.
引用
收藏
页码:331 / +
页数:2
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