TEM analysis of Gd5(SixGe1-x)4, where x=1/2

被引：9
作者：
Meyers, JS
Chumbley, S [1 ]
Laabs, F
Pecharsky, AO
机构：
[1] Iowa State Univ, Ames Lab, Ames, IA 50011 USA
[2] Iowa State Univ, Dept Mat Sci & Engn, Ames, IA 50011 USA
来源：
ACTA MATERIALIA | 2003年 / 51卷 / 01期
关键词：
transmission electron microscopy; rare earth; phase transition; ferroelastic; Gd5Si2Ge2;
D O I：
10.1016/S1359-6454(02)00227-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The material Gd-5(SixGe1-x)(4), with x=1/2 was investigated using transmission electron microscopy. The material possesses a complex crystallographic structure and undergoes a unique, reversible, transformation at low temperatures and an irreversible high temperature transformation. The high, room and low temperature microstructures of arc-melted and heat treated samples are reported. Direct observation of the transformation with a discussion on the mechanism of the reversible, low temperature, phase transformation is detailed. (C) 2002 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：61 / 70
页数：10
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