A custom built lathe designed for in operando high-energy x-ray studies at industrially relevant cutting parameters

被引:3
作者
Rogstrom, L. [1 ]
Chen, Y. H. [1 ]
Joesaar, M. P. Johansson [1 ,2 ]
Eriksson, J. [2 ]
Fallqvist, M. [2 ]
Andersson, J. M. [2 ]
Schell, N. [3 ]
Oden, M. [1 ]
Birch, J. [4 ]
机构
[1] Linkoping Univ, Dept Phys Chem & Biol IFM, Nanostruct Mat, S-58183 Linkoping, Sweden
[2] Seco Tools AB, S-73782 Fagersta, Sweden
[3] HZG, Max Planck Str 1, D-21502 Geesthacht, Germany
[4] Linkoping Univ, Dept Phys Chem & Biol IFM, Thin Film Phys, S-58183 Linkoping, Sweden
基金
瑞典研究理事会;
关键词
TOOL-CHIP INTERFACE; FORMATION ZONE; TEMPERATURE; DECOMPOSITION; STRESSES; MICROSTRUCTURE; DIFFRACTION; COATINGS; WEAR;
D O I
10.1063/1.5091766
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present a custom built lathe designed for in operando high-energy x-ray scattering studies of the tool-chip and tool-workpiece contact zones during operation. The lathe operates at industrially relevant cutting parameters, i.e., at cutting speeds <= 400 m/min and feeds <= 0.3 mm/rev. By turning tests in carbon steel, performed at the high-energy material science beamline P07 at Petra III, DESY, Hamburg, we observe compressive strains in TiNbAlN and Al2O3/Ti(C, N) coatings on the tool flank face during machining. It is demonstrated that by the right choice of substrate and coating materials, diffraction patterns can be recorded and evaluated in operando, both from the tool-workpiece and tool-chip contacts, i.e., from the contact zones between the tool and the workpiece material on the tool flank and rake faces, respectively. We also observe that a worn tool results in higher temperature in the tool-chip contact zone compared to a new tool. Published under license by AIP Publishing.
引用
收藏
页数:9
相关论文
共 35 条
  • [1] Pressure enhancement of the isostructural cubic decomposition in Ti1-xAlxN
    Alling, B.
    Oden, M.
    Hultman, L.
    Abrikosov, I. A.
    [J]. APPLIED PHYSICS LETTERS, 2009, 95 (18)
  • [2] Strain and texture analysis of coatings using high-energy x-rays
    Almer, J
    Lienert, U
    Peng, RL
    Schlauer, C
    Odén, M
    [J]. JOURNAL OF APPLIED PHYSICS, 2003, 94 (01) : 697 - 702
  • [3] The microstructure of the affected zone of a worn PCBN cutting tool characterised with SEM and TEM
    Angseryd, J.
    Coronel, E.
    Elfwing, M.
    Olsson, E.
    Andren, H. -O.
    [J]. WEAR, 2009, 267 (5-8) : 1031 - 1040
  • [4] Space resolved microstructural characteristics in the chip formation zone of orthogonal cut C45E steel samples characterized by diffraction experiments
    Broemmelhoff, Katrin
    Henze, Steffen
    Gerstenberger, Robert
    Fischer, Torben
    Schell, Norbert
    Uhlmann, Eckart
    Reimers, Walter
    [J]. JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2013, 213 (12) : 2211 - 2216
  • [5] Modeling tool stresses and temperature evaluation in turning using finite element method
    Chandrasekaran, H
    Thuvander, A
    [J]. MACHINING SCIENCE AND TECHNOLOGY, 1998, 2 (02) : 355 - 367
  • [6] Effects of decomposition route and microstructure on h-AlN formation rate in TiCrAlN alloys
    Chen, Y. H.
    Rongstrom, L.
    Ostach, D.
    Ghafoor, N.
    Johansson-Joesaar, M. P.
    Schell, N.
    Birch, J.
    Oden, M.
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2017, 691 : 1024 - 1032
  • [7] White layers and thermal modeling of hard turned surfaces
    Chou, YK
    Evans, CJ
    [J]. INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1999, 39 (12) : 1863 - 1881
  • [8] In situ determination of internal stresses in mixed ceramic cutting tools during friction testing using synchrotron radiation
    Eichenseer C.
    Hartig C.
    Schell N.
    Hintze W.
    [J]. Eichenseer, C. (eichenseer@tuhh.de), 1600, Springer Verlag (08): : 513 - 519
  • [9] In situ measurement of lattice strains in mixed ceramic cutting tools under thermal and mechanical loads using synchrotron radiation
    Eichenseer C.
    Wittmann I.
    Hartig C.
    Schneider G.A.
    Schell N.
    Hintze W.
    [J]. Production Engineering, 2013, 7 (2-3) : 283 - 289
  • [10] Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy
    Flink, A.
    M'Saoubi, R.
    Giuliani, F.
    Sjolen, J.
    Larsson, T.
    Persson, P. O. A.
    Johansson, M. P.
    Hultman, L.
    [J]. WEAR, 2009, 266 (11-12) : 1237 - 1240