Beam test of a full-length prototype of the BESIII drift chamber with the readout electronics

被引:9
|
作者
Qin, Z. H. [1 ]
Chen, Y. B.
Sheng, H. Y.
Wu, L. H.
Liu, J. B.
Zhuang, B. A.
Jiang, X. S.
Zhao, Y. B.
Zhu, K. J.
Yan, Z. K.
Chen, C.
Xu, M. H.
Wang, L.
Ma, X. Y.
Tang, X.
Liu, R. G.
Jin, Y.
Zhu, Q. M.
Zhang, G. F.
Wu, Z.
Li, R. Y.
Zhao, P. P.
Dai, H. L.
Li, X. P.
Li, J.
机构
[1] CAS, Inst High Energy Phys, Beijing 100049, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
[3] Hunan Univ, Microelectron Lab, Dept Phys, Changsha 410082, Peoples R China
关键词
BESIII; drift chambers; prototype; readout electronics; resolution; beam tests; threshold;
D O I
10.1016/j.nima.2006.11.032
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A full-length prototype of the BESIII drift chamber together with its readout electronics was built and a beam test was performed. Two different methods, namely "single-threshold method" and "double-threshold method" for timing measurement, were studied. Test results show that the BESIII drift chamber and its readout electronics can reach their design specifications. The "double-threshold method" results in a better timing accuracy and noise suppression capabilities as compared with the "single-threshold method". (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:612 / 621
页数:10
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