Hall effect and transmission electron microscopy of epitaxial MnSi thin films

被引：35
|
作者：
Meynell, S. A. [1 ]
Wilson, M. N. [1 ]
Loudon, J. C. [2 ]
Spitzig, A. [1 ]
Rybakov, F. N. [3 ]
Johnson, M. B. [1 ]
Monchesky, T. L. [1 ]
机构：
[1] Dalhousie Univ, Dept Phys & Atmospher Sci, Halifax, NS B3H 3J5, Canada
[2] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB3 0FS, England
[3] Russian Acad Sci, MN Miheev Inst Met Phys, Ural Branch, Ekaterinburg 620990, Russia
来源：
PHYSICAL REVIEW B | 2014年 / 90卷 / 22期
基金：
加拿大自然科学与工程研究理事会; 加拿大创新基金会;
关键词：
REAL-SPACE OBSERVATION; SKYRMION LATTICE; MAGNETIC SKYRMIONS; BERRY PHASE; CUBIC FEGE; FERROMAGNETS; CRYSTALS; STATE;
D O I：
10.1103/PhysRevB.90.224419
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
We present Hall-effect measurements on MnSi/Si(111) epilayers and find an anomalous Hall contribution that is significantly smaller than that in bulk crystals, which enables the observation of an additional contribution to the anomalous signal previously overlooked in MnSi. Our measurements indicate the signal is not due to skyrmions in MnSi thin films, which are absent in out-of-plane fields, but rather are the result of scattering from the cone phase. The absence of magnetic contrast in the transmission electron microscopy (TEM) measurements is consistent with this interpretation [T. L. Monchesky et al., Phys. Rev. Lett. 112, 059701 (2014)]. We provide a method to model TEM images of skyrmion lattices to determine the conditions necessary for their observation in other B20 epilayers with an anisotropy that is favorable to their formation.
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页数：10
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