Reliability of Palladium Coated Copper Wire

被引:15
作者
Stephan, Dominik [1 ]
Wulff, Frank W. [2 ]
Milke, Eugen [2 ]
机构
[1] Heraeus Mat Singapore Pte Ltd, Block 5002 Ang Mo Kio Ave 5,04-05 TECHPl 2, Singapore 569871, Singapore
[2] WC Heraeus GmbH Hanau, Contact Mat Div, D-63450 Hanau, Germany
来源
2010 12TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE (EPTC) | 2010年
关键词
PdCu wire; FAB; Intermetallic; Reliability; BONDS; GOLD;
D O I
10.1109/EPTC.2010.5702660
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Alternative solutions for Au wire are high in demand as a result of increasing gold price and high demand for lower cost packages. Copper wire has been the natural low cost alternative but concerns on corrosion susceptibility and package reliability have driven the industry to look for better alternative wire materials while maintaining substantial material cost savings. PdCu wire is supposed to close this gap and serves a promising solution for applications that require cost effectiveness (still significant cost saving over gold) and robust bonding performance (closer to that of gold wire). One critical question in the industry currently is, whether or not PdCu wire can address the reliability concerns, which are occurring at some copper wire applications in the field. This paper will cover the intermetallic phase growth of PdCu wire on Al pad metallization at as bonded condition and tries to understand whether or not there is any difference at the interface compared to bare copper, during initial bonding and during reliability testing like HTS, HAST and PCT.
引用
收藏
页码:343 / 348
页数:6
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