High-precision absolute distance measurement using dual-laser frequency scanned interferometry under realistic conditions

被引:33
|
作者
Yang, Hai-Jun [1 ]
Nyberg, Sven [1 ]
Riles, Keith [1 ]
机构
[1] Univ Michigan, Dept Phys, Ann Arbor, MI 48109 USA
基金
美国国家科学基金会;
关键词
frequency scanned interferometry; absolute distance measurement; optical alignment system; International Linear Collider; silicon detector;
D O I
10.1016/j.nima.2007.02.101
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this paper, we report on new high-precision absolute distance measurements performed with frequency scanned interferometry using a pair of single-mode optical fibers. Absolute distances were determined by counting the interference fringes produced while scanning the frequencies of the two chopped lasers. High-finesse Fabry-Perot interferometers were used to determine frequency changes during scanning. Dual lasers with oppositely scanning directions, combined with a multi-distance-measurement technique previously reported, were used to cancel drift errors and to suppress vibration effects and interference fringe uncertainties. Under realistic conditions, a precision about 0.2 mu m was achieved for a distance of 0.41 m. With a precision that exceeds requirements, the frequency scanned interferometry is a promising high-precision optical alignment technique for International Linear Collider silicon tracker detector. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:395 / 401
页数:7
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