Performance evaluation of a cheap, open source, digital environmental monitor based on the Raspberry Pi

被引:46
作者
Lewis, A. J. [1 ]
Campbell, M. [1 ]
Stavroulakis, P. [1 ,2 ]
机构
[1] Natl Phys Lab, Hampton Rd, Teddington TW11 0LW, Middx, England
[2] Univ Nottingham, Nottingham NG7 2RD, England
关键词
Environment; Calibration; Metrology; Air sensor; Open source; Data logging; REFRACTIVE-INDEX; AIR;
D O I
10.1016/j.measurement.2016.03.023
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report on the design, construction and evaluation of a low-cost digital environmental monitoring system based on a popular micro-computer board and mass market digital sensors. The system is based around the use of open source software and readily available digital sensors, providing key parameters required for environmentally-controlled calibration laboratories: air temperature, pressure and humidity. Each system logs data at set intervals with front-panel display, web page graphical display and email alerting when exceeding set tolerances. The sensors have been calibrated at the National Physical Laboratory using standards traceable to the SI. Long term stability of the system is estimated and in addition to monitoring of laboratory environments for regulatory purposes, the systems can also be used to provide on-demand values for local refractive index with an expanded (k = 2) uncertainty of 1.1 x 10(-7) as required for many optical-based measuring systems. Crown Copyright (C) 2016 Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码:228 / 235
页数:8
相关论文
共 13 条
[1]  
[Anonymous], SHT75 DAT
[2]  
[Anonymous], 2015, PYTH PACK SOURC COD
[3]  
[Anonymous], 2015, CACT NETW DAT GRAPH
[4]  
[Anonymous], BMP180 DAT
[5]  
[Anonymous], 2002, GEOM PROD SPEC GPS S
[6]  
[Anonymous], 2002, 17025 ISO
[7]  
[Anonymous], INTERNET THINGS
[8]   CORRECTION TO THE UPDATED EDLEN EQUATION FOR THE REFRACTIVE-INDEX OF AIR [J].
BIRCH, KP ;
DOWNS, MJ .
METROLOGIA, 1994, 31 (04) :315-316
[9]   Refractive index of air: New equations for the visible and near infrared [J].
Ciddor, PE .
APPLIED OPTICS, 1996, 35 (09) :1566-1573
[10]  
Edlen B., 1966, Metrologia, V2, P71, DOI DOI 10.1088/0026-1394/2/2/002