Hard x-ray Fresnel prisms: Properties and applications

被引：1

作者：

Ablett, JM ^{[1
]}

Evans-Lutterodt, K ^{[1
]}

Stein, A ^{[1
]}

机构：

[1] Brookhaven Natl Lab, Natl Synchrotron Light Source Dept, Upton, NY 11973 USA

来源：

DESIGN AND MICROFABRICATION OF NOVEL X-RAY OPTICS II | 2004年 / 5539卷

关键词：

D O I：

10.1117/12.560323

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：88 / 94

页数：7

共 10 条

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