The Equivalent Investigation of Natural Contamination and Artificial Contamination Test

被引:0
|
作者
Peng, Gongmao [1 ]
Guan, Zhicheng [1 ]
Zhang, Fuzeng [1 ]
Wang, Liming [1 ]
机构
[1] Tsinghua Univ, Grad Sch Shenzhen, Shenzhen 518055, Peoples R China
关键词
Deposit density; Distributing of nastiness; Components of salt; DC flashover voltage; INSULATORS;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In order to study how the factors (NSDD, distribution of nastiness, components of salt, etc) influenced the flashover characteristics of insulators, the artificial contamination tests were carried out for composite insulators in the conditions of different non-soluble deposit density (NSDD) and different distribution of nastiness and different components of salt in the area of high-altitude Kunming. The paper concludes that the relationship between the coefficient of modifiability of NSDD and NSDD was a negative power function in the condition of equivalent salt deposit density (ESDD) remained constant and the NSDD of insulators was no more than 1.0 mg/cm(2); the flashover voltage increased with the degree of un-uniform pollution distributing in the condition of NSDD remains constant; the relationship between the coefficient of modifiability of the different components and the proportion of CaSO4 was an exponent function in the condition of ESDD remained constant. These results would be useful in calculating the DC flashover voltage of composite insulators in the condition of natural contamination, and can also be treated as basis for outdoor insulator selection of transmission lines.
引用
收藏
页码:1000 / 1003
页数:4
相关论文
共 50 条
  • [1] Equivalent investigation of natural contamination and artificial contamination test
    Guan, Zhi-Cheng
    Peng, Gong-Mao
    Zhang, Fu-Zeng
    Li, Jian
    Mei, Hong-Wei
    Wang, Li-Ming
    Gaodianya Jishu/High Voltage Engineering, 2010, 36 (08): : 1871 - 1876
  • [2] Investigation of Natural and Artificial Contamination on Various Types of Insulators
    Vinothkumar, R.
    Kannayeram, G.
    Shunmugalakshmi, G.
    2015 INTERNATIONAL CONFERENCE ON INNOVATIONS IN INFORMATION, EMBEDDED AND COMMUNICATION SYSTEMS (ICIIECS), 2015,
  • [3] Investigation of natural contamination layer growth on optical substrates
    蒋励
    黄秋实
    Igor VKozhevnikov
    姚逸云
    冯江涛
    冯宇飞
    马彬
    焦宏飞
    陈鸿
    张众
    王占山
    Chinese Physics C, 2018, 42 (11) : 109 - 121
  • [4] Investigation of natural contamination layer growth on optical substrates
    蒋励
    黄秋实
    Igor V.Kozhevnikov
    姚逸云
    冯江涛
    冯宇飞
    马彬
    焦宏飞
    陈鸿
    张众
    王占山
    Chinese Physics C, 2018, (11) : 109 - 121
  • [5] Investigation of natural contamination layer growth on optical substrates
    Jiang, Li
    Huang, Qiu-Shi
    Kozhevnikov, Igor V.
    Yao, Yi-Yun
    Feng, Jiang-Tao
    Feng, Yu-Fei
    Ma, Bin
    Jiao, Hong-Fei
    Chen, Hong
    Zhang, Zhong
    Wang, Zhan-Shan
    CHINESE PHYSICS C, 2018, 42 (11)
  • [6] Study on Artificial Contamination Test of Typical Transmission Line Insulators
    Gu, Chunhui
    Lu, Guojun
    Yi, Mancheng
    Li, Jiangtao
    2015 5TH INTERNATIONAL CONFERENCE ON ELECTRIC UTILITY DEREGULATION AND RESTRUCTURING AND POWER TECHNOLOGIES (DRPT 2015), 2015, : 1624 - 1627
  • [7] NATURAL INSULATOR CONTAMINATION TEST-RESULTS ON VARIOUS SHED SHAPES IN HEAVY INDUSTRIAL CONTAMINATION AREAS
    LIN, X
    CHEN, Z
    LIU, X
    CHU, K
    MORITA, K
    MATSUOKA, R
    ITO, S
    IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1992, 27 (03): : 593 - 600
  • [8] Natural Contamination Deposition Characteristics Based on Natural Contamination Testing Station
    Dong, Hongchuan
    Xu, Wenjie
    Cao, Bin
    Wang, Liming
    Guan, Zhicheng
    2015 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP), 2015, : 403 - 406
  • [9] Investigation of Contamination of Anionites by Humus Substances of Natural Waters.
    Kas'yanenko, E.I.
    Vakulenko, V.A.
    Pashkov, A.B.
    Prokhorova, A.M.
    Saldadze, K.M.
    Samborskii, I.V.
    Zubkova, Z.N.
    Iygi, Yu.G.
    Teploenergetika, 1980, (06): : 25 - 27
  • [10] Comparison of on-load voltage methods in artificial contamination test for insulators
    Graduate School at Shenzhen, Tsinghua University, Shenzhen 518055, China
    不详
    不详
    Zhang, C. (zcy615@foxmail.com), 2013, Science Press (39):