The influences of device geometry and p-type doping on a solution-processed polymer space-charge-limited transistor

被引:11
作者
Chao, Yu-Chiang [2 ]
Chen, Chun-Yu [2 ]
Zan, Hsiao-Wen [1 ]
Meng, Hsin-Fei [2 ]
机构
[1] Natl Chiao Tung Univ, Dept Photon, Hsinchu 300, Taiwan
[2] Natl Chiao Tung Univ, Inst Phys, Hsinchu 300, Taiwan
关键词
HIGH-PERFORMANCE; TRANSPORT;
D O I
10.1088/0022-3727/43/20/205101
中图分类号
O59 [应用物理学];
学科分类号
摘要
A polymer vertical transistor with an on/off current ratio higher than 10(4) is demonstrated. The proposed space-charge limited transistor (SCLT) uses a metal-grid base containing high-density submicrometre openings to modulate the vertical space-charge-limited current (SCLC). The key to obtaining a high on/off current ratio is to reduce the leakage current of SCLT. In this paper, an improved device structure that isolates the grid metal by using both top and bottom insulating layers is demonstrated. Then, with an identical proposed structure, the geometric design is also found to significantly influence the on/off ratio over 3 orders of magnitude. The competition between the SCLC and the grid to collector leakage current is analysed. Finally, the influence of tetrafluoro-tetracyano-quinodimethane doping on the transistor characteristics is investigated. The results are important for the design of polymer vertical transistors with high on/off ratios.
引用
收藏
页数:6
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