Comparative analysis on microhardness and third order nonlinear optical traits of pure and Nd3+ doped zinc tris-thiourea sulphate (ZTS) crystal

Present investigation is aimed to explore the single crystal growth, microhardness and third order nonlinear optical (TONLO) properties of Nd3+ doped zinc tris-thiourea sulphate (ZTS) crystal. The commercial slow solvent evaporation technique has been chosen to grow a good quality ZTS (12 mm x 0.5 mm x 0.3 mm) and Nd3+ doped ZTS (11 mm x 0.6 mm x 0.4 mm) single crystals. Vickers microhardness test has been employed to analyze the influence of Nd3+ dopant on the hardness behavior of ZTS single crystal. The TONLO effects occurring in Nd3+ doped ZTS single crystal have been evaluated by means of Z-scan technique using a He-Ne laser operating at 632.8 nm. The close and open aperture Z-scan configuration have been used to determine the nature of TONLO refraction n(2) and absorption beta, respectively. The magnitudes of vital TONLO parameters, such as refraction n(2), absorption coefficient beta, figure of merit and susceptibility chi(3) of the Nd3+ doped ZTS single crystal, have been determined using Z-scan transmittance data. The n2, beta, and chi(3) of Nd3+ doped ZTS single crystal were found to be of the order of 10(-10) cm(2)/W, 10(-6) cm/W, cm/W and 10(-5) esu, respectively.