Structural and electrical characterizations of single tetragonal FeSe on Si substrate

被引:32
作者
Wu, X. J.
Zhang, Z. Z.
Zhang, J. Y.
Ju, Z. G.
Shen, D. Z.
Li, B. H.
Shan, C. X.
Lu, Y. M.
机构
[1] Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, Key Lab Excited State Proc, Changchun 130033, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
crystal structure; X-ray diffraction; metal organic chemical vapor deposition; magnetic materials;
D O I
10.1016/j.jcrysgro.2006.12.048
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
(001)-Oriented FeSe thin films were successfully fabricated by metal organic chemical vapor deposition on Si substrate with large thermal mismatch. X-ray diffraction and X-ray photoelectron spectroscopy measurements indicate that the films are of single tetragonal phase FeSe. Hysteresis loop indicates that the FeSe structure is ferromagnetic at room temperature with coercive force of 260Oe. The FeSe films show p-type conduction with carrier concentration of 10(21) cm(-3), and the anomalous Hall effect was discussed. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:483 / 485
页数:3
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