THz Applications for Non-Destructive Testing

被引:0
|
作者
Beckmann, Joerg [1 ]
Spranger, Holger [1 ]
Ewert, Uwe [1 ]
机构
[1] Bundesanstalt Mat Forsch & Prufung BAM, Berlin, Germany
关键词
THz radiation; Terahertz synthetic aperture; dielectric materials; image reconstruction; RECONSTRUCTION;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Up to now THz-TDS-systems aren't considered to be nondestructive testing facilities for large scale industrial applications, despite it was proven that they provide a comprehensive set of quality parameters. A practical approach to bring THz-TDS in addition to already existing testing systems into the industrial mainstream is systematic development of future test procedures and test facilities for dielectrics. For this purpose polyethylene test specimen with introduced artefacts were designed, to evaluate the detection sensitivity of Time of Flight measurements based on dielectrics. SAFT reconstructed tomograms are presented which visualize the sizes and location of artificially introduced flaws.
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页码:272 / 276
页数:5
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