Calculations of the Mueller matrix for scattering of light from two-dimensional surfaces

被引：22

作者：

Bruce, NC ^{[1
]}

机构：

[1] Natl Autonomous Univ Mexico, Ctr Instrumentos, Mexico City 04510, DF, Mexico

来源：

WAVES IN RANDOM MEDIA | 1998年 / 8卷 / 01期

关键词：

D O I：

10.1088/0959-7174/8/1/004

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Results are presented of an analysis of the Mueller matrix parameters for the problem of scattering of light from two-dimensional rough surfaces. The Mueller matrix fully describes the polarization properties of the scattered light. It is shown, using symmetry arguments, that for normal incidence it is necessary to measure the Mueller matrix terms in only one plane, thus reducing the amount of data to be analysed. Examples of the form of the Mueller matrix terms are calculated using a simple ray-trace approach.

引用

页码：15 / 28

页数：14

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