Multiscale X-ray imaging using ptychography

被引:7
作者
Sala, Simone [1 ,2 ,3 ]
Kuppili, Venkata S. C. [1 ,2 ]
Chalkidis, Stefanos [1 ]
Batey, Darren J. [2 ]
Shi, Xiaowen [2 ]
Rau, Christoph [2 ]
Thibault, Pierre [3 ]
机构
[1] UCL, Dept Phys & Astron, Mortimer St, London WC1E 6BT, England
[2] Harwell Sci & Innovat Campus, Diamond Light Source, Didcot OX11 0DE, Oxon, England
[3] Univ Southampton, Dept Phys & Astron, Southampton SO17 1BJ, Hants, England
来源
JOURNAL OF SYNCHROTRON RADIATION | 2018年 / 25卷
基金
欧洲研究理事会;
关键词
ptychography; X-ray imaging; coherent diffraction; phase contrast; scanning transmission X-ray microscopy; COMPUTED-TOMOGRAPHY; MICROSCOPY; RESOLUTION; NANOTOMOGRAPHY;
D O I
10.1107/S1600577518007221
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The success of ptychography and other imaging experiments at third-generation X-ray sources is apparent from their increasingly widespread application and the improving quality of the images they produce both for resolution and contrast and in terms of relaxation of experimental constraints. The wider availability of highly coherent X-rays stimulates the development of several complementary techniques which have seen limited mutual integration in recent years. This paper presents a framework in which some of the established imaging techniques - with particular regard for ptychography - are flexibly applied to tackle the variable requirements occurring at typical synchrotron experiments. In such a framework one can obtain low-resolution images of whole samples and smoothly zoom in on specific regions of interest as they are revealed by switching to a higher-resolution imaging mode. The techniques involved range from full-field microscopy, to reach the widest fields of view (>mm), to ptychography, to achieve the highest resolution (<100nm), and have been implemented at the I13 Coherence Branchline at Diamond Light Source.
引用
收藏
页码:1214 / 1221
页数:8
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