Hollow cathode plasma electron source for low temperature deposition of cobalt films by electron-enhanced atomic layer deposition

被引:8
作者
Sobell, Zachary C. [1 ]
Cavanagh, Andrew S. [1 ]
Boris, David R. [2 ]
Walton, Scott G. [2 ]
George, Steven M. [1 ]
机构
[1] Univ Colorado, Dept Chem, Boulder, CO 80309 USA
[2] Naval Res Lab, 4555 Overlook Ave SW, Washington, DC 20375 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2021年 / 39卷 / 04期
关键词
BEAM GENERATED PLASMAS; DESORPTION; EMISSION; METALS;
D O I
10.1116/6.0001033
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The development of a hollow cathode plasma electron source (HC-PES) facilitated the rapid nucleation and low temperature deposition of thin cobalt films using electron-enhanced atomic layer deposition (EE-ALD). The Co EE-ALD was performed near room temperature (30-60 degrees C) using sequential exposures of cobalt tricarbonyl nitrosyl and low energy (100-200 eV) electrons. Electron-stimulated desorption of CO and NO surface species creates open sites for precursor adsorption to facilitate the low temperature film growth. The HC-PES displayed high electron currents, rapid ALD cycling, and low susceptibility to chemical interference. Electron steering optics were also used to mitigate the effects of sputtering in the HC-PES. The high electron currents from the HC-PES yielded rapid nucleation of cobalt films in as few as four EE-ALD cycles with Co growth rates over 2 angstrom/cycle on areas >4 cm(2). In high aspect ratio structures, transmission electron microscopy and energy dispersive spectroscopy analyses revealed a 4:1 topographical selectivity in favor of horizontal compared with vertical surfaces. This selectivity was attributed to the directional electron flux from the HC-PES. This topographical area selective deposition suggests that Co EE-ALD may be successful in achieving bottom-up fill of trenches and vias.
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页数:11
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