Magnetic and structural properties of stoichiometric thin Fe3Si/GaAs(001) films

被引:22
作者
Ionescua, A
Vaz, CAF
Trypiniotis, T
Gürtler, CM
Vickers, ME
García-Miquel, H
Bland, JAC [1 ]
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[2] Univ Cambridge, Dept Mat Sci & Met, Cambridge CB2 3QZ, England
[3] Univ Politecn Valencia, Dept Elect Engn, Sensor & Magnetism Grp, Valencia 46022, Spain
关键词
Fe3Si/GaAs(001); interface roughness; magnetic moment; Schottky barrier; spin detection;
D O I
10.1016/j.jmmm.2004.09.042
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this study, we report experimental results on the structural and magnetic properties of epitaxial Fe3Si films grown on GaAs(0 0 1) by co-evaporation. X-ray reflectivity shows that relatively smooth interfaces are obtained (roughness approximate to0.7 nm for the Fe3Si/GaAs interface), while SQUID magnetometry yields a magnetic moment Of 0.9 mu(B)/atom at room temperature, close to the bulk value. From magneto-optic Kerr effect measurements the cubic anisotropy constant was estimated as K-1 = 3.1 X 10(4) erg/cm(3). The electrical transport properties were also investigated by I-V and photoexcitation measurements, which show a Schottky behaviour (with a barrier height of 0.51 eV) and that spin detection is possible in this system. (0 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:72 / 76
页数:5
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