Application of laser plasma soft X-ray and EUV sources in micro- and nanotechnology

被引:3
|
作者
Fiedorowicz, Henryk [1 ]
Bartnik, Andrzej [1 ]
Jakubczak, Krzysztof [1 ]
Jarocki, Roman [1 ]
Juha, Libor [2 ,3 ]
机构
[1] Mil Univ Technol, Inst Optoelect, 2 Kaliskiego St, PL-00908 Warsaw, Poland
[2] Inst Phys, Joint Res Lab PALS, Prague 18221, Czech Republic
[3] ASCR, Inst Plasma Phys, Prague 18221, Czech Republic
来源
LASER TECHNOLOGY VIII: APPLICATIONS OF LASERS | 2007年 / 6598卷
关键词
microstructures; photo-etching; X-rays; EUV;
D O I
10.1117/12.726547
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Results on micro- and nanoprocessing of organic polymers using X-rays and extreme ultraviolet (EUV) generated from laser-plasma radiation sources are presented in the paper. The sources used in the studies are based on the gas puff target approach developed at the Institute of Optoelectronics, Warsaw. Processing of polymers is connected with non-thermal ablation under the influence of energetic photons of X-ray and EUV radiation. The process can be useful for practical applications as it makes possible to produce structures with sub-micron spatial resolution that is not possible using the thermal ablation. The new technology will be used for production of photonic microstructures and for modification of polymer surfaces for biomedical applications..
引用
收藏
页数:8
相关论文
共 50 条
  • [1] Multilayers for EUV, soft X-ray and X-ray optics
    Wang, Zhanshan
    Huang, Qiushi
    Zhang, Zhong
    TERAHERTZ, RF, MILLIMETER, AND SUBMILLIMETER-WAVE TECHNOLOGY AND APPLICATIONS IX, 2016, 9747
  • [2] Micro- and nanoprocessing of organic polymers using a compact laser plasma EUV source equipped with EUV optical systems
    Fiedorowicz, Henryk
    Bartnik, Andrzej
    Jakubczak, Krzysztof
    Jarocki, Roman
    Kostecki, Jerzy
    Pina, Ladislav
    Rakowski, Rafal
    Szczurek, Anna
    Szczurek, Miroslaw
    ULTRAFAST X-RAY SOURCES AND DETECTORS, 2007, 6703
  • [3] EUV/soft x-ray multilayer optics
    Yulin, S
    Feigl, T
    Benoit, N
    Kaiser, N
    ADVANCED MICROLITHOGRAPHY TECHNOLOGIES, 2005, 5645 : 289 - 298
  • [4] EUV and soft X-ray multilayer optics
    Kaiser, N
    Yulin, S
    Feigl, T
    Bernitzki, H
    Lauth, H
    ADVANCES IN OPTICAL THIN FILMS, 2003, 5250 : 109 - 118
  • [5] Development of an EUV reflectometer using a laser-plasma x-ray source
    Kondo, H
    Kandaka, N
    Sugisaki, K
    Oshino, T
    Shiraishi, M
    Ishiyama, W
    Murakami, K
    ADVANCES IN LABORATORY-BASED X-RAY SOURCES AND OPTICS, 2000, 4144 : 76 - 81
  • [6] Space Soft X-ray and EUV Optics in CIOMP
    CHEN Bo NI Qiliang WANG Junlin State Key Lab of Applied OpticsChangchun Institute of Optics Fine Mechanics and Physics Chinese Academy of SciencesChangchun China
    光机电信息, 2006, (12) : 40 - 43
  • [7] Development of Multilayer Optics for the EUV, Soft X-ray and X-ray Regions in Tongji University
    WANG Zhan shan ZHU Jing tao WANG Hong chang WANG Feng li CHEN Ling yan Institute of Precision Optical Engineering Department of Physics Tongji University Shanghai China
    光机电信息, 2005, (12) : 12 - 21
  • [8] Non-periodic multilayer coatings in EUV, soft X-ray and X-ray range
    Wang, Zhanshan
    ADVANCES IN OPTICAL THIN FILMS III, 2008, 7101
  • [10] Space solar telescope in soft X-ray and EUV band
    Bo Chen
    Zhen Liu
    Lin Yang
    Liang Gao
    Fei He
    XiaoGuang Wang
    QiLiang Ni
    Science in China Series G: Physics, Mechanics and Astronomy, 2009, 52 : 1806 - 1809