In situ HREM study on the structural instability of isolated nanometre-sized alloy particles in the Sn-Bi system

被引:6
|
作者
Lee, JG [1 ]
Mori, H [1 ]
机构
[1] Osaka Univ, Res Ctr Ultra High Voltage Elect Microscopy, Suita, Osaka 5650871, Japan
来源
JOURNAL OF ELECTRON MICROSCOPY | 2003年 / 52卷 / 01期
关键词
in situ TEM; structural instability; nm-sized alloy particle; tin and bismuth; interfacial energy; eutectic temperature;
D O I
10.1093/jmicro/52.1.57
中图分类号
TH742 [显微镜];
学科分类号
摘要
The structural instability of isolated nm-sized alloy particles has been investigated by in situ transmission electron microscopy, using particles in the Sn-Bi system. In a pure tin (Sn) particle, no structural fluctuation was induced under electron-beam irradiation. In a tin-rich solid solution particle, an orientational fluctuation took place at a rate of approximately once per 1-3 s. In a high concentration alloy particle with a two-phase microstructure, a structural fluctuation occurred at a rate of a few hertz. Namely, the fluctuation became more frequent with increasing bismuth (Bi) concentration, no matter whether it consists of a single phase or multiple phases. A good parallelism can be found between this fluctuation enhancement with bismuth concentration and the fact that the free-energy difference between a solid particle and the corresponding liquid one decreases continuously with bismuth concentration and approaches a value close to zero at the eutectic composition. These results lead to a view that a nm-sized solid particle exhibits a structural instability under electron-beam irradiation when the free-energy difference between a solid particle and the corresponding liquid one is reduced to a value close to zero.
引用
收藏
页码:57 / 62
页数:6
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