In situ HREM study on the structural instability of isolated nanometre-sized alloy particles in the Sn-Bi system
被引:6
|
作者:
Lee, JG
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h-index: 0
机构:
Osaka Univ, Res Ctr Ultra High Voltage Elect Microscopy, Suita, Osaka 5650871, JapanOsaka Univ, Res Ctr Ultra High Voltage Elect Microscopy, Suita, Osaka 5650871, Japan
Lee, JG
[1
]
Mori, H
论文数: 0引用数: 0
h-index: 0
机构:
Osaka Univ, Res Ctr Ultra High Voltage Elect Microscopy, Suita, Osaka 5650871, JapanOsaka Univ, Res Ctr Ultra High Voltage Elect Microscopy, Suita, Osaka 5650871, Japan
Mori, H
[1
]
机构:
[1] Osaka Univ, Res Ctr Ultra High Voltage Elect Microscopy, Suita, Osaka 5650871, Japan
来源:
JOURNAL OF ELECTRON MICROSCOPY
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2003年
/
52卷
/
01期
关键词:
in situ TEM;
structural instability;
nm-sized alloy particle;
tin and bismuth;
interfacial energy;
eutectic temperature;
D O I:
10.1093/jmicro/52.1.57
中图分类号:
TH742 [显微镜];
学科分类号:
摘要:
The structural instability of isolated nm-sized alloy particles has been investigated by in situ transmission electron microscopy, using particles in the Sn-Bi system. In a pure tin (Sn) particle, no structural fluctuation was induced under electron-beam irradiation. In a tin-rich solid solution particle, an orientational fluctuation took place at a rate of approximately once per 1-3 s. In a high concentration alloy particle with a two-phase microstructure, a structural fluctuation occurred at a rate of a few hertz. Namely, the fluctuation became more frequent with increasing bismuth (Bi) concentration, no matter whether it consists of a single phase or multiple phases. A good parallelism can be found between this fluctuation enhancement with bismuth concentration and the fact that the free-energy difference between a solid particle and the corresponding liquid one decreases continuously with bismuth concentration and approaches a value close to zero at the eutectic composition. These results lead to a view that a nm-sized solid particle exhibits a structural instability under electron-beam irradiation when the free-energy difference between a solid particle and the corresponding liquid one is reduced to a value close to zero.
机构:
Osaka Univ, Res Ctr Ultrahigh Voltage Electron Microscopy, Suita, Osaka 5650871, JapanOsaka Univ, Res Ctr Ultrahigh Voltage Electron Microscopy, Suita, Osaka 5650871, Japan
Mori, H
Lee, JG
论文数: 0引用数: 0
h-index: 0
机构:
Osaka Univ, Res Ctr Ultrahigh Voltage Electron Microscopy, Suita, Osaka 5650871, JapanOsaka Univ, Res Ctr Ultrahigh Voltage Electron Microscopy, Suita, Osaka 5650871, Japan