k-space optical microscopy of nanoparticle arrays: Opportunities and artifacts

We report on the performance and inherent artifacts of k-space optical microscopy for the study of periodic arrays of nanoparticles under the various illumination configurations available on an inverted optical microscope. We focus on the origin of these artifacts and the ways to overcome or even benefit from them. In particular, a recently reported artifact, called the "condenser effect," is demonstrated here in a new way. The consequences of this artifact (which is due to spurious reflections in the objective) on Fourier-space imaging and spectroscopic measurements are analyzed in detail. The advantages of using k-space optical microscopy to determine the optical band structure of plasmonic arrays and to perform surface plasmon resonance experiments are demonstrated. Potential applications of k-space imaging for the accurate lateral and axial positioning of the sample in optical microscopy are investigated. Published by AIP Publishing.