Fault tree analysis in case of multiple faults, especially covered and uncovered ones

被引:6
作者
Schneeweiss, WG [1 ]
机构
[1] Fern Univ, D-58084 Hagen, Germany
来源
MICROELECTRONICS AND RELIABILITY | 1998年 / 38卷 / 04期
关键词
D O I
10.1016/S0026-2714(97)00183-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It is shown that by a proper adaptation of Boolean algebra, multiple faults can be modeled for a subsequent fault tree analysis in an exceptionally convenient way. Specifically, the problem of properly modeling coverage can be solved satisfactorily. The approach is not only very simple to understand, but also, due to symbolic calculations, very attractive in cases where many sets of input parameters are to be processed quickly. (Note that this is not a paper on multi-valued analysis.) (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:659 / 663
页数:5
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