OPTICAL AND STRUCTURAL CHARACTERIZATION OF CdTe THIN FILMS BY CHEMICAL BATH DEPOSITION TECHNIQUE

被引：0

作者：

Deivanayaki, S. ^{[1
]}

Jayamurugan, P. ^{[1
]}

Mariappan, R. ^{[1
]}

Ponnuswamy, V. ^{[1
]}

机构：

[1] Sri Ramakrishna Miss Vidyalaya Coll Arts & Sci, Dept Phys, Coimbatore 641020, Tamil Nadu, India

来源：

CHALCOGENIDE LETTERS | 2010年 / 7卷 / 03期

关键词：

Cadmium telluride film; Chemical bath deposition; UV-VIS-NIR spectroscopy; XRD; SEM; VAPOR-DEPOSITION; EPITAXY; GROWTH; SI(111); SI;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The CdTe thin films were prepared by chemical bath deposition technique using commercial glass substrates with bath temperature 85 degrees C and annealing temperatures 350 degrees C, 400 degrees C and 450 degrees C. The X-ray diffraction (XRD) analysis shows that the prepared samples are polycrystalline in nature. A significant increase in the XRD peak intensities for the CdTe films after annealing can be observed.. Optical absorption shows the presence of direct transition with band gap energy 1.5eV and after annealing it decreases to 1.4eV. Scanning electron microscopy (SEM) reveals that spherically shaped grains are more uniformly distributed over the surface of the substrate for the CdTe films.

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页码：159 / 163

页数：5

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