Microstructured polymer tips for scanning near-field optical microscopy

被引：9

作者：

Stürmer, H

Köhler, JM

Jovin, TM

机构：

[1] Inst Phys High Technol, D-07702 Jena, Germany

[2] Max Planck Inst Biophys Chem, D-37070 Gottingen, Germany

来源：

ULTRAMICROSCOPY | 1998年 / 71卷 / 1-4期

关键词：

scanning probe microscopy; scanning near-field optical microscopy; atomic force microscopy; reactive ion etching; polymer tips;

D O I：

10.1016/S0304-3991(97)00097-1

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A new technique for producing polymeric cantilevers with integrated tips for combined scanning-force microscopy/scanning near-field optical microscopy is described in this paper. By integration reactive ion of etched polymeric and fluorescent tips to polymer-based cantilevers, it will become possible to produce apertureless sensors for a scanning near-field optical microscope with the well-known atomic-force distance control. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：107 / 110

页数：4

共 26 条

[1] NEAR-FIELD SCANNING OPTICAL MICROSCOPY (NSOM) - DEVELOPMENT AND BIOPHYSICAL APPLICATIONS [J].