Sequential interfacial reactions of Au/In/Au transient liquid phase-bonded joints for power electronics applications

被引:15
作者
Yoon, Jeong-Won [1 ]
Lee, Byung-Suk [1 ]
机构
[1] Korea Inst Ind Technol KITECH, Welding & Joining R&D Grp, 156 Gaetbeol Ro, Incheon 21999, South Korea
关键词
Power electronics; Intermetallic compound; Transient liquid phase bonding; Gold-indium system; Interface; DIE-ATTACH; CU-SN; INDIUM; SILVER; RELIABILITY; PERFORMANCE; TECHNOLOGY; MODULES; HYBRID;
D O I
10.1016/j.tsf.2018.04.039
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The transient liquid phase (TLP) bonding of Au/In/Au as a die-attach material for high-temperature applications was studied in this work. The sequential interfacial reactions between Au and In layers and the phase transformations of an In solder to the intermetallic compound (IMC) phases of the Au/In/Au joints were investigated for TLP bonding at 190 degrees C for up to 30 min under different bonding pressures (0.2-10 MPa). The TLP joint was fully converted into the Au-rich Au7In3 IMC. During TLP bonding, the In solder was sequentially transformed in the following order: I (Au7In3, AuIn, and AuIn2), II (Au7In3 and AuIn), and III (Au7In3). We effectively fabricated the Au/In/Au TLP-bonded joint under moderate bonding pressures of 5 and 10 MPa for a short bonding time.
引用
收藏
页码:618 / 624
页数:7
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