Studying the Effect of the Annealing on Ag2Se Thin Film

This paper investigates the annealing effect on the silver selenide (Ag2Se) thin films. The Ag2Se thin films are established through the use of a thermal evaporation technique based on a glass substrate with thickness of 450nm.These thin films are annealed with different temperature values, i.e., (375, 450) k. In this study, the X-ray and atomic force microscopy (AFM) based-techniques are used to investigate the physical structure properties of the Ag2Se thin films. In addition, the absorbance and transmittance spectra are further investigated and recorded according to the range of wavelength from (400-1000) Nano mater (nm) with 3 different variations of temperature values. The results show that the greatest absorbance value in the sample is achieved at the temperature treatment of 450k while the largest transmittance value is obtained at temperature of 300k. Furthermore, the nature of electronic transitions is also evaluated in this paper. The results demonstrate that the thin films under consideration have a direct allowed transition with an optical energy gap of (1.9) and (1.7, 1.4) electron volt (eV) before and after annealing, respectively.