Compositional profiles in silica-based sol-gel films doped with erbium and silver, by RBS and ERDA

被引:6
|
作者
Marques, AC
Almeida, RM
Ramos, AR
Alves, E
机构
[1] Inst Super Tecn, Dept Mat Engn, P-1049001 Lisbon, Portugal
[2] Inst Tecnol & Nucl, EN 10, P-2685953 Sacavem, Portugal
[3] Univ Lisbon, CFN, P-1649003 Lisbon, Portugal
关键词
erbium-doped waveguides; silver-doped waveguides; silica-titania films; RBS/ERDA studies;
D O I
10.1023/B:JSST.0000048005.33044.8b
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The photoluminescence efficiency of Er- doped silica- titania planar waveguides, prepared by sol- gel processing, may in principle be enhanced through the incorporation of silver metal particles. On the other hand, the presence of residual OH groups limits the optical activity of the Er3+ ions. In this work, we have used Rutherford Backscattering Spectrometry ( RBS), combined with Elastic Recoil Detection Analysis ( ERDA), in order to study the incorporation of Ag and H species as a function of the heat treatments used to densify the sol- gel films. Ultraviolet - visible spectroscopy and Fourier transform infrared ( FTIR) spectroscopy were used to support and expand the interpretation of the RBS and ERDA data. The RBS results indicate a homogeneous distribution of Er in the as- deposited films. On the contrary, Ag displays a bimodal in- depth profile, centred at the air/ film and film/ Si substrate interfaces. Heat treatments at up to 700degrees C eventually lead to in- diffusion and segregation of most of the Ag species at the latter interface. The hydrogen concentration reaches minimum values after heat treatments at 500 and 900degrees C, with apparently larger values for temperatures in between. During these heat treatments, the Er profile remains stable.
引用
收藏
页码:287 / 291
页数:5
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