Determination of ore concentrates by energy dispersive X-ray fluorescence spectrometry

被引:4
作者
Polat, R [1 ]
Gürol, A [1 ]
Ekinci, N [1 ]
Çakir, C [1 ]
Bastug, A [1 ]
Budak, G [1 ]
Karabulut, A [1 ]
机构
[1] Ataturk Univ, Fac Sci & Art, Dept Phys, Erzurum, Turkey
来源
JOURNAL OF TRACE AND MICROPROBE TECHNIQUES | 2003年 / 21卷 / 01期
关键词
quantitative and qualitative analysis; energy dispersive X-ray fluorescence; standard addition method; concentration; trace element;
D O I
10.1081/TMA-120017892
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
EDXRF analysis has broad applications in the quantitative analysis of major and minor elements in geological, geochemical, and environmental studies, including the fields of sedimentology, stratigrapy, geochemistry, and mineral exploration. Evaluation of its potential for the analysis of major and minor elements in Bozalt and Dedemaksut ores were performed. Physical basis of used standard addition method, experimental set-up, the procedure of sample preparation and the results of analysis were presented. The correlation coefficients for each or elements analyzed (r greater than 0.986) were achieved.
引用
收藏
页码:63 / 71
页数:9
相关论文
共 30 条
[1]  
Angeyo KH, 1998, X-RAY SPECTROM, V27, P205, DOI 10.1002/(SICI)1097-4539(199805/06)27:3<205::AID-XRS277>3.3.CO
[2]  
2-A
[3]  
ASLAN H, 2001, J TRACE MICROPROBE T, V19, P439
[4]  
Borkhodoev VY, 1998, J TRACE MICROPROBE T, V16, P341
[5]  
Budak G, 1999, J TRACE MICROPROBE T, V17, P309
[6]   X-ray fluorescence analysis of malachite ore concentrates in the Narman region [J].
Budak, G ;
Karabulut, A .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1999, 54 (06) :985-988
[7]  
Carvalho ML, 1998, X-RAY SPECTROM, V27, P198, DOI 10.1002/(SICI)1097-4539(199805/06)27:3<198::AID-XRS265>3.3.CO
[8]  
2-2
[9]   DETERMINATION OF TRACE-ELEMENTS IN ALUMINUM WITH SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE [J].
CHEVALLIER, P ;
ABBAS, K ;
SAINFORT, P .
X-RAY SPECTROMETRY, 1991, 20 (06) :293-295
[10]   Determination of some trace elements in mineral spring waters by total reflection X-ray fluorescence spectrometry (TXRF) [J].
Dogan, M ;
Soylak, M .
JOURNAL OF TRACE AND MICROPROBE TECHNIQUES, 2002, 20 (02) :261-268