Structural and Fluorescence Studies of Polycrystalline -Al2O3 Obtained From Sulfuric Acid Anodic Alumina

被引:14
作者
Chernyakova, Katsiaryna [1 ]
Karpicz, Renata [2 ]
Rutkauskas, Danielis [2 ]
Vrublevsky, Igor [1 ]
Hassel, Achim Walter [3 ]
机构
[1] Belarusian State Univ Informat & Radioelect, P Brovka 6, Minsk, BELARUS
[2] Ctr Phys Sci & Technol, Sauletekio Ave 3, Vilnius, Lithuania
[3] Johannes Kepler Univ Linz, Inst Chem Technol Inorgan Mat, Altenbergerstr 69, Linz, Austria
来源
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2018年 / 215卷 / 16期
关键词
anodic alumina; fluorescence; polycrystalline alumina; sulfuric acid; thermal analysis; OPTICAL-PROPERTIES; NANOSTRUCTURED ALUMINA; OXIDE FILMS; LUMINESCENCE; PHOTOLUMINESCENCE; FABRICATION; MEMBRANES; NANOCRYSTALLINE; GAMMA-AL2O3; TEMPERATURE;
D O I
10.1002/pssa.201700892
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the present study, robust -Al2O3 specimens (144 mu m thick) are obtained by the heat treatment at 1400 degrees C of free-standing sulfuric acid anodic alumina. Scanning electron microscopy analysis show that the as-anodized anodic alumina films possess well-ordered porous structure with the pore diameter of about 10.2nm. After heat treatment at 1400 degrees C the samples lose their porous structure and certain crystallites with average size of 5-6 mu m can be observed. These crystallites can be visualized by fluorescence imaging. According to differential scanning calorimetry data accomplished by X-ray analysis, the first step of crystallization occurs at around 967 degrees C, producing -Al2O3. The second one takes place at around 1194 degrees C, which corresponds to the formation of -Al2O3. For the as-anodized and samples treated at temperatures below 1200 degrees C the band at 420nm can be attributed to the emission of OH-related and other impurities centers. The fluorescence at 460nm relates to emission of oxygen defect centers, such as F and F-2 centers, and sharp bands at 678 and 693nm indicate the formation of highly crystalline alumina. For -Al2O3, its fluorescence is caused by both surface defects and oxygen defect centers. The fluorescence spectroscopy can be applied as a cheap, fast, nondestructive method for the identification of amorphous alumina crystallization.
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页数:6
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