Atomic and Kelvin probe force microscopy of thin films

被引：0
作者：
Alessandrini, A [1 ]
Valdrè, U [1 ]
机构：
[1] Univ Bologna, Dept Phys, INFM, I-40126 Bologna, Italy
来源：
PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY | 2001年
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中图分类号：
TH742 [显微镜];
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页码：553 / 554
页数：2
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