Instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry

被引:54
作者
Chiu, MH
Wang, SF
Chang, RS
机构
[1] Natl Huwei Univ Sci & Technol, Dept Electropt Engn, Huwei Yunlin 632, Taiwan
[2] Natl Cent Univ, Inst Opt Sci, Tao Yuan 320, Taiwan
关键词
D O I
10.1364/AO.43.005438
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new instrument for measuring small angles by use of multiple total internal reflections in heterodyne interferometry is presented. With this instrument we can achieve a small rotation angle only by measuring the variation in phase difference between s- and p-polarization states. To improve its sensitivity we increase the number of total internal reflections by using two parallelogram prisms instead of two right-angle prisms. The angular resolution of the new instrument is better than 2.2 X 10(-6) rad over the measurement range -2.12degrees less than or equal to theta less than or equal to 2.12degrees for 20 total-internal reflections. The experimental results and the theoretical curve are in good agreement. (C) 2004 Optical Society of America.
引用
收藏
页码:5438 / 5442
页数:5
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