Functional vector generation for sequential HDL models under an observability-based code coverage metric

被引:7
作者
Fallah, F [1 ]
Ashar, P
Devadas, S
机构
[1] Amer Inc, Fujitsu Labs, Sunnyvale, CA 94085 USA
[2] NEC USA, CCRL, Princeton, NJ 08540 USA
[3] MIT, Comp Sci Lab, Cambridge, MA 02139 USA
关键词
coverage metric; HSAT; observability; observability-based code coverage metric (OCCOM); satisfiability; test vector; validation;
D O I
10.1109/TVLSI.2002.808438
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Design validation and verification is the process of ensuring correctness of a design described at different levels of abstraction during the design process. Design validation is the main bottleneck in improving design turnaround time. Currently, simulation is the primary methodology for validation of the first description of a design. In this paper we integrate directed search methods and observability-based code coverage metric (OCCOM) computation into an algorithm for generating test vectors under OCCOM for sequential HDL models. A prototype system for design validation under OCCOM has been built. The system uses repeated coverage computation to minimize the number of vectors generated. Experimental results using the test vector generation system are presented.
引用
收藏
页码:919 / 923
页数:5
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