Growth and properties of amorphous Ti-B-Si-N thin films deposited by hybrid HIPIMS/DC-magnetron co-sputtering from TiB2 and Si targets

被引:14
作者
Fager, H. [1 ]
Greczynski, G. [1 ]
Jensen, J. [1 ]
Lu, J. [1 ]
Hultman, L. [1 ]
机构
[1] Linkoping Univ, Dept Phys Chem & Biol IFM, Thin Film Phys Div, SE-58183 Linkoping, Sweden
基金
瑞典研究理事会;
关键词
HIPIMS; Transmission electron microscopy (TEM); Amorphous; Thin films; TiBSiN; Hardness; MECHANICAL-PROPERTIES; MICROSTRUCTURE; OXIDATION; COATINGS; HARDNESS; MODULUS; SPECTRA;
D O I
10.1016/j.surfcoat.2014.10.053
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Amorphous nitrides are explored for their homogeneous structure and potential use as wear-resistant coatings, beyond their much studied nano- and microcrystalline counterparts. (TiB2)(1-x)SixN thin films were deposited on Si(001) substrates by a hybrid technique of high power impulse magnetron sputtering (HIPIMS) combined with dc magnetron sputtering (DCMS) using TiB2 and Si targets in a N-2/Ar atmosphere. By varying the sputtering dc power to the Si target from 200 to 2000 W while keeping the average power to the TiB2-target, operated in HIPIMS mode, constant at 4000 W, the Si content in the films increased gradually from x = 0.01 to x = 0.43. The influence of the Si content on the microstructure, phase constituents, and mechanical properties was systematically investigated. The results show that the microstructure of as-deposited (TiB2)(1-x)SixN films changes from nanocrystalline with 2-4 nm TiN grains for x = 0.01 to fully electron diffraction amorphous for x = 022. With increasing Si content, the hardness of the films increases from 8.5 GPa with x = 0.01 to 17.2 GPa with x = 0.43. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:442 / 447
页数:6
相关论文
共 46 条
[1]   X-RAY-DIFFRACTION STUDY OF THE AMORPHOUS STRUCTURE OF CHEMICALLY VAPOR-DEPOSITED SILICON-NITRIDE [J].
AIYAMA, T ;
FUKUNAGA, T ;
NIIHARA, K ;
HIRAI, T ;
SUZUKI, K .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1979, 33 (02) :131-139
[2]   Ion-assisted physical vapor deposition for enhanced film properties on nonflat surfaces [J].
Alami, J ;
Persson, POÅ ;
Music, D ;
Gudmundsson, JT ;
Bohmark, J ;
Helmersson, U .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2005, 23 (02) :278-280
[3]  
[Anonymous], PLASMA CHEM PLASMA P
[4]  
[Anonymous], 1995, Handbook of X-ray Photoelectron Spectroscopy. A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data
[5]   Screening effects in the Ti 2p core level spectra of Ti-based ternary nitrides [J].
Arranz, A. ;
Palacio, C. .
SURFACE SCIENCE, 2006, 600 (12) :2510-2517
[6]  
Barsoum MW., 2003, FUNDAMENTALS CERAMIC
[7]   Ionization of sputtered metals in high power pulsed magnetron sputtering [J].
Bohlmark, J ;
Alami, J ;
Christou, C ;
Ehiasarian, AP ;
Helmersson, U .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2005, 23 (01) :18-22
[8]  
Briggs D., 1993, PRACTICAL SURFACE AN
[9]   COLUMNAR MICROSTRUCTURE IN VAPOR-DEPOSITED THIN-FILMS [J].
DIRKS, AG ;
LEAMY, HJ .
THIN SOLID FILMS, 1977, 47 (03) :219-233
[10]   Microstructure and oxidation-resistance of Til-x-y-zAlxCryYzN layers grown by combined steered-arc/unbalanced-magnetron-sputter deposition [J].
Donohue, LA ;
Smith, IJ ;
Munz, WD ;
Petrov, I ;
Greene, JE .
SURFACE & COATINGS TECHNOLOGY, 1997, 94-5 (1-3) :226-231