Run sum control charts for the monitoring of process variability

被引：11

作者：

Rakitzis, Athanasios C. ^{[1
]}

Antzoulakos, Demetrios L. ^{[2
]}

机构：

[1] Univ Nantes, Inst Univ Technol Nantes, Nantes, France

[2] Univ Piraeus, Dept Stat & Insurance Sci, Piraeus, Greece

来源：

QUALITY TECHNOLOGY AND QUANTITATIVE MANAGEMENT | 2016年 / 13卷 / 01期

关键词：

Average extra quadratic loss; average run length; control charts; Markov chain; process variability; run sum; runs rules; sample standard deviation; statistical process control; ZONE CONTROL CHART; S-CHARTS; PERFORMANCE; RULES; DESIGN; SHEWHART; SCHEMES;

D O I：

10.1080/16843703.2016.1139842

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A two-sided run sum S control chart is proposed and its average run length performance is evaluated via a Markov chain technique. The performance of the chart is compared to several well-known control-charting procedures for the monitoring of process variability. One-sided counterparts of the proposed run sum charts are also discussed. The numerical results demonstrate an improved performance of the run sum S control charts as compared with control charts with runs rules, especially in the detection of increasing shifts in process variability. A practical guidance for the selection of the appropriate charting procedure is also given.

引用

页码：58 / 77

页数：20

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