Run sum control charts for the monitoring of process variability

被引:11
|
作者
Rakitzis, Athanasios C. [1 ]
Antzoulakos, Demetrios L. [2 ]
机构
[1] Univ Nantes, Inst Univ Technol Nantes, Nantes, France
[2] Univ Piraeus, Dept Stat & Insurance Sci, Piraeus, Greece
来源
关键词
Average extra quadratic loss; average run length; control charts; Markov chain; process variability; run sum; runs rules; sample standard deviation; statistical process control; ZONE CONTROL CHART; S-CHARTS; PERFORMANCE; RULES; DESIGN; SHEWHART; SCHEMES;
D O I
10.1080/16843703.2016.1139842
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A two-sided run sum S control chart is proposed and its average run length performance is evaluated via a Markov chain technique. The performance of the chart is compared to several well-known control-charting procedures for the monitoring of process variability. One-sided counterparts of the proposed run sum charts are also discussed. The numerical results demonstrate an improved performance of the run sum S control charts as compared with control charts with runs rules, especially in the detection of increasing shifts in process variability. A practical guidance for the selection of the appropriate charting procedure is also given.
引用
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页码:58 / 77
页数:20
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