共 8 条
[1]
Bian X. H., 2012, IEEE INT C EL PACK T
[3]
High-Frequency Electrical Model of Through-Silicon Vias for 3-D Integrated Circuits Considering Eddy Current and Proximity Effects
[J].
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,
2017, 7 (12)
:2036-2044
[5]
Electrical Modeling and Characterization of Silicon-Core Coaxial Through-Silicon Vias in 3-D Integration
[J].
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY,
2018, 8 (08)
:1336-1343
[6]
Salah K., 2010, IEEE INT C MICR EG D
[7]
Yin X. K., 2018, IEEE T MICROWAVE THE