All-optical bit-error monitoring system using cascaded inverted wavelength converter and optical NOR gate

被引：57

作者：

Chan, LY ^{[1
]}

Qureshi, KK

Wai, PKA

Moses, B

Lui, LFK

Tam, HY

Demokan, MS

机构：

[1] Hong Kong Polytech Univ, Photon Res Ctr, Kowloon, Hong Kong, Peoples R China

[2] Hong Kong Polytech Univ, Dept Elect & Informat Engn, Kowloon, Hong Kong, Peoples R China

[3] Hong Kong Polytech Univ, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2003年 / 15卷 / 04期

关键词：

bit-error monitoring; injection locking; optical data processing; optical logic gate;

D O I：

10.1109/LPT.2003.809298

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel all-optical bit-error monitoring system is demonstrated by cascading two all-optical logic gates: an inverted wavelength converter and an optical NOR gate which are realized using injection-locked laser diodes operating at different thresholds. Real-time optical monitoring signal is generated which indicates, the positions and duration of both bit and burst errors in 10-Gb/s nonreturn-to-zero signals.

引用

页码：593 / 595

页数：3

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