Spatial coherence characterization of undulator radiation

被引：53

作者：

Chang, C ^{[1
]}

Naulleau, P

Anderson, E

Attwood, D

机构：

[1] Lawrence Berkeley Lab, Ctr Xray Opt, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Dept Elect Engn & Comp Sci, Berkeley, CA 94720 USA

来源：

OPTICS COMMUNICATIONS | 2000年 / 182卷 / 1-3期

关键词：

D O I：

10.1016/S0030-4018(00)00811-7

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The coherence properties of undulator radiation at extreme ultraviolet (EW) wavelengths are measured using the Thompson-Wolf two-pinhole method. The effects of asymmetric source size and beamline apertures are observed. High spatial coherence EUV radiation is demonstrated. Projection of these same capabilities to the x-ray region is straightforward. Published by Elsevier Science B.V.

引用

页码：25 / 34

页数：10

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