Growth of GaN free-standing nanowires by plasma-assisted molecular beam epitaxy: structural and optical characterization

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作者
Tchernycheva, M. [1 ]
Sartel, C.
Cirlin, G.
Travers, L.
Patriarche, G.
Harmand, J-C
Dang, Le Si
Renard, J.
Gayral, B.
Nevou, L.
Julien, F.
机构
[1] Alcatel Alsthom Rech, Route Nozay, Lab Photon & Nanostruct, CNRS UPR20, F-91460 Marcoussis, France
[2] Univ Paris 11, Inst Elect Fondamentale, CNRS, UMR 8622, F-91405 Orsay, France
[3] Russian Acad Sci, St Petersburg Phys & Technol Ctr Res & Educ, St Petersburg 195220, Russia
[4] Univ Grenoble 1, Spectrometrie Phys Lab, Equipe CEA CNRS UJF Nanophys & Semicond, F-38402 St Martin Dheres, France
[5] CEA Grenoble, DRFMC SP2M PSC, Equipe CEA CNRS UJF Nanophys & Semicond, F-38054 Grenoble, France
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中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
This paper reports on the growth, structural and optical properties of GaN free-stranding nanowires synthesized in catalyst- free mode on Si( 111) substrate by plasma-assisted molecular beam epitaxy. Cylindrical nanowires with a hexagonal cross-section defined by {10 (1) over bar0} planes and diameters down to 20 nm were observed. The nanowire length increases as a function of their diameter, following the Gibbs - Thomson expression. The growth rate in the lateral direction was studied using thin A1N marker layers showing that the lateral over axial growth rate ratio can be tuned from similar to 1% to similar to 10% by changing the III/ V flux ratio, with the lateral growth remaining homogeneous along the NW axis. Nanowire ensembles showed a strong near band edge photoluminescence up to room temperature. Low-temperature micro-photoluminescence from a single wire is peaked at 3.478 eV with broadening of 6 - 10 meV. This emission is similar to the luminescence of nanowire ensembles, which demonstrates strain homogeneity from wire to wire. The optical properties along the wire axis probed by micro-cathodoluminescence were found to be uniform, with no evidence of a higher defect density in the bottom part of the nanowires next to the Si substrate.
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页数:7
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