Testing the realistic bridging faults in CMOS circuits

被引：0
|
作者：
Song, PL [1 ]
Lo, JC [1 ]
机构：
[1] UNIV RHODE ISL,DEPT ELECT & COMP ENGN,KINGSTON,RI 02881
来源：
1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS | 1996年
关键词：
D O I：
10.1109/IDDQ.1996.557838
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：84 / 88
页数：5
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