Testing the realistic bridging faults in CMOS circuits

被引：0
|
作者：
Song, PL [1 ]
Lo, JC [1 ]
机构：
[1] UNIV RHODE ISL,DEPT ELECT & COMP ENGN,KINGSTON,RI 02881
来源：
1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS | 1996年
关键词：
D O I：
10.1109/IDDQ.1996.557838
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：84 / 88
页数：5
相关论文
共 50 条
  • [31] EXHAUSTIVE TESTING OF STUCK-OPEN FAULTS IN CMOS COMBINATIONAL-CIRCUITS
    BATE, JA
    MILLER, DM
    IEE PROCEEDINGS-E COMPUTERS AND DIGITAL TECHNIQUES, 1988, 135 (01): : 10 - 16
  • [32] On modeling and testing of lithography related open faults in nano-CMOS circuits
    Sreedhar, Aswin
    Sanyal, Alodeep
    Kundu, Sandip
    Proceedings -Design, Automation and Test in Europe, DATE, 2008, : 616 - 621
  • [33] On modeling and testing of lithography related open faults in nano-CMOS circuits
    Sreedhar, Aswin
    Sanyal, Alodeep
    Kundu, Sandip
    2008 DESIGN, AUTOMATION AND TEST IN EUROPE, VOLS 1-3, 2008, : 533 - 538
  • [34] Two modeling techniques for CMOS circuits to enhance test generation and fault simulation for bridging faults
    Lee, KJ
    Tang, JJ
    PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96), 1996, : 165 - 170
  • [35] An efficient I-DDQ test generation scheme for bridging faults in CMOS digital circuits
    Chen, TH
    Hajj, IN
    Rudnick, EM
    Patel, JH
    1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1996, : 74 - 78
  • [36] DESIGN OF CMOS SELF-CHECKING SEQUENTIAL-CIRCUITS WITH IMPROVED DETECTABILITY OF BRIDGING FAULTS
    METRA, C
    FAVALLI, M
    RICCO, B
    ELECTRONICS LETTERS, 1994, 30 (23) : 1934 - 1936
  • [37] Efficient double fault diagnosis for CMOS logic circuits with a specific application to generic bridging faults
    Kao, HC
    Tsai, MF
    Huang, SY
    Wu, CW
    Chang, WF
    Lu, SK
    JOURNAL OF INFORMATION SCIENCE AND ENGINEERING, 2003, 19 (04) : 571 - 587
  • [38] TESTING OF NONFEEDBACK BRIDGING FAULTS
    CHAKRAVARTY, S
    INTEGRATION-THE VLSI JOURNAL, 1990, 9 (02) : 109 - 127
  • [39] Testing of CMOS circuits
    Veitsman, I.N., 1600,
  • [40] TESTING CMOS CIRCUITS
    VEITSMAN, NI
    KONDRATEVA, OM
    AUTOMATION AND REMOTE CONTROL, 1991, 52 (02) : 139 - 162
12345