Testing the realistic bridging faults in CMOS circuits

被引：0

作者：

Song, PL ^{[1
]}

Lo, JC ^{[1
]}

机构：

[1] UNIV RHODE ISL,DEPT ELECT & COMP ENGN,KINGSTON,RI 02881

来源：

1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS | 1996年

关键词：

D O I：

10.1109/IDDQ.1996.557838

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：84 / 88

页数：5

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