In-circuit fault tolerance for FPGAs using dynamic reconfiguration and virtual overlays

被引:6
作者
Kourfali, Alexandra [1 ]
Stroobandt, Dirk [1 ]
机构
[1] Univ Ghent, Dept Elect & Informat Syst ELIS, Technol Pk Zwijnaarde 126, B-9052 Ghent, Belgium
关键词
Radiation sensitivity; Single event upsets; Fault tolerance; SRAM-based FPGAs; Reconfiguration; Scrubbing; Triple modular redundancy; ERROR-DETECTION;
D O I
10.1016/j.microrel.2019.113438
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reassuring fault tolerance in computing systems is an important problem in high-reliability applications. With the interest in commercial SRAM-based FPGAs in radiation environments, it is beneficial to provide runtime reconfigurable recovery from a failure. In this paper a virtual coarse-grained reconfigurable architecture is proposed, with an embedded on-demand fault-mitigation technique tailored for FPGA overlays. The proposed method performs spatial redundancy and run-time recovery. This approach can achieve up to 3 x faster runtime recovery with 20% less resources in FPGA devices, by providing integrated layers of fault mitigation.
引用
收藏
页数:14
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