CHAOS CONTROL OF ATOMIC FORCE MICROSCOPE SYSTEM USING NONLINEAR MODEL PREDICTIVE CONTROL

Owing to robust and optimal specification, model predictive control method has received wide attentions over recent years. Since in certain operational conditions, an Atomic/scanning Force Microscope (AFM) shows chaos behavior, the chaos feedback control of the AFM system is considered. According to the nonlinear model of forces interacting between the tip of micro cantilever and the substrate of AFM; the nonlinear control methods are proposed. In the paper, the chaos control of a micro cantilever AFM based on the nonlinear model predictive control (NMPC) technique is presented. Through software simulation results, the effectiveness of the designed NMPC of the AFM is assessed. The simulation results together with analytical stability proofs indicate that the proposed method is effective in keeping the system in a stable range.